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|a 073229466
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|a ocm00966412
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|a DYNIX_BUNAN_97875
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|a 19740729d1964 u y1engy0103 ba
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|a eng
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|a XX
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|a y # 100|y
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| 200 |
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|a Ellipsometry in the measurement of surfaces and thin films
|e symposium proceedings
|f @Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
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| 210 |
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|a Washington
|c U.S. National Bureau of Standards
|d 1964
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| 215 |
|
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|a vi, 359p.
|c illus.
|d 24cm
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| 300 |
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|a Edited by E. Passaglia, R.R. Strombery, and J. Kruger
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| 410 |
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| |
|0 013676636
|a United States
|t Miscellaneous publication
|f United states Department of agriculture, Science and education administration
|c Washington (D.C.)
|n U.S. Department of agriculture
|
| 606 |
|
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|3 PPN031694276
|a Ellipsométrie
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|a Kruger
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|a Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
|e Washington, D.C
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