Holdings: Ellipsometry in the measurement of surfaces and thin films

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Bibliographic Details
Corporate Author :	Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C
Other Authors :	Passaglia Elio (Éditeur scientifique), Stromberg Robert R. (Éditeur scientifique), Kruger Jerome (Éditeur scientifique)
Format :	Book
Language :	anglais
Title statement :	Ellipsometry in the measurement of surfaces and thin films : symposium proceedings / @Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Published :	Washington : U.S. National Bureau of Standards , 1964
Physical Description :	vi, 359p.
Series :	Miscellaneous publication United states Department of agriculture, Science and education administration
Subjects :	Ellipsométrie

Holdings details from BU Sciences
Location	Call Number	Loan type	Status
Magasin n.3	535.562 ETA /10429	Empruntable	Available