Ellipsometry in the measurement of surfaces and thin films : symposium proceedings
Saved in:
Corporate Author : | |
---|---|
Other Authors : | , , |
Format : | Book |
Language : | anglais |
Title statement : | Ellipsometry in the measurement of surfaces and thin films : symposium proceedings / @Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films |
Published : |
Washington :
U.S. National Bureau of Standards
, 1964 |
Physical Description : | vi, 359p. |
Series : | Miscellaneous publication United states Department of agriculture, Science and education administration |
Subjects : |
Notes : | Edited by E. Passaglia, R.R. Strombery, and J. Kruger |
---|