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| LEADER |
01429cam a2200433 4500 |
| 001 |
PPN128446765 |
| 005 |
20181031133300.0 |
| 010 |
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|
|a 978-0-521-81934-3
|b rel.
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| 010 |
|
|
|a 0-521-81934-2
|b rel.
|
| 020 |
|
|
|a US
|b 2006037298
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| 020 |
|
|
|a GB
|b A6A6039
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| 035 |
|
|
|a ocm76167306
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| 035 |
|
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|z ocm77256927
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| 035 |
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|z ocm171125868
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| 035 |
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|z ocm171140845
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| 100 |
|
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|a 20081020d2007 k y0frey0103 ba
|
| 101 |
0 |
|
|a eng
|
| 102 |
|
|
|a GB
|
| 105 |
|
|
|a a a 001yy
|
| 106 |
|
|
|a r
|
| 200 |
1 |
|
|a Extended defects in semiconductors
|b Texte imprimé
|e electronic properties, device effects and structures
|f D.B. Holt, B.G. Yacobi
|
| 210 |
|
|
|a Cambridge
|a New York
|c Cambridge University Press
|d 2007
|
| 215 |
|
|
|a 1 vol. (XI-631 p.)
|c ill.
|d 26 cm
|
| 320 |
|
|
|a Références bibliogr. en fin de chapitres. Index.
|
| 606 |
|
|
|3 PPN027282570
|a Semiconducteurs
|3 PPN027790320
|x Défauts
|2 rameau
|
| 606 |
|
|
|3 PPN031688780
|a Dislocations dans les semiconducteurs
|2 rameau
|
| 676 |
|
|
|a 621.3815/2
|v 22
|
| 680 |
|
|
|a TK7871.852
|b .H65 2007
|
| 686 |
|
|
|a TK7871.852
|2 nlc
|
| 686 |
|
|
|a TK7871 .852
|b H65 2007
|2 nlc
|
| 700 |
|
1 |
|3 PPN032134150
|a Holt
|b D. B.
|4 070
|
| 701 |
|
1 |
|3 PPN08588331X
|a Yacobi
|b B. G.
|4 070
|
| 801 |
|
3 |
|a FR
|b Abes
|c 20081205
|g AFNOR
|
| 801 |
|
1 |
|a US
|b OCLC
|g AACR2
|
| 801 |
|
2 |
|a FR
|b AUROC
|g AFNOR
|
| 801 |
|
0 |
|b DLC
|g AACR2
|
| 801 |
|
2 |
|b BAKER
|g AACR2
|
| 930 |
|
|
|5 441092105:389030570
|b 441092105
|j u
|
| 998 |
|
|
|a 529643
|
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