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Semiconductor material and device characterization
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| Auteur principal : | |
|---|---|
| Format : | Livre |
| Langue : | anglais |
| Titre complet : | Semiconductor material and device characterization / Dieter K. Schroder |
| Édition : | 3è éd. |
| Publié : |
[Piscataway, NJ], Hoboken, N.J. :
IEEE Press
, cop. 2006 Wiley |
| Description matérielle : | 1 vol. (xv-779 p.) |
| Sujets : |
| LEADER | 01070nam a2200337 4500 | ||
|---|---|---|---|
| 001 | PPN09847829X | ||
| 005 | 20150116014200.0 | ||
| 010 | |a 0-471-73906-5 |b acid-free paper | ||
| 020 | |a US |b 2005048514 | ||
| 020 | |a GB |b A573304 | ||
| 100 | |a 20060323d2006 k y0frey0103 ba | ||
| 101 | 0 | |a eng | |
| 102 | |a US | ||
| 105 | |a a a 001|y | ||
| 106 | |a r | ||
| 200 | 1 | |a Semiconductor material and device characterization |b Texte imprimé |f Dieter K. Schroder | |
| 205 | |a 3è éd. | ||
| 210 | |a [Piscataway, NJ] |c IEEE Press |a Hoboken, N.J. |c Wiley |d cop. 2006 | ||
| 215 | |a 1 vol. (xv-779 p.) |c ill. |d 25 cm | ||
| 300 | |a "Wiley-Interscience." | ||
| 320 | |a Bibliogr.. Index | ||
| 606 | |3 PPN027282570 |a Semiconducteurs |2 rameau | ||
| 606 | |3 PPN027282570 |a Semiconducteurs |3 PPN027791718 |x Tests |2 rameau | ||
| 676 | |a 621.3815/2 |v 22 | ||
| 680 | |a QC611 |b .S335 2006 | ||
| 700 | 1 | |3 PPN032963238 |a Schroder |b Dieter K |4 070 | |
| 801 | 3 | |a FR |b Abes |c 20060323 |g AFNOR | |
| 801 | 0 | |b DLC |g AACR2 | |
| 801 | 2 | |b BAKER |g AACR2 | |
| 930 | |5 441092105:263860965 |b 441092105 |j u | ||
| 998 | |a 449748 | ||