Semiconductor material and device characterization

Semiconductor material and device characterization

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Bibliographic Details
Main Author : Schroder Dieter K (Auteur)
Format : Book
Language : anglais
Title statement : Semiconductor material and device characterization / Dieter K. Schroder
Edition : 3è éd.
Published : [Piscataway, NJ], Hoboken, N.J. : IEEE Press , cop. 2006
Wiley
Physical Description : 1 vol. (xv-779 p.)
Subjects :
Semiconducteurs
Semiconducteurs > Tests

BU Sciences

Holdings details from BU Sciences
Location Call Number Loan type Status
1er étage, salle 12 621.381 SCH Empruntable Available