|
|
|
|
| LEADER |
00694nam a2200205 4500 |
| 001 |
PPN072486805 |
| 005 |
20031225010300.0 |
| 009 |
DYNIX_BUNAN_188 |
| 010 |
|
|
|a 0815512007
|b vol.1
|
| 100 |
|
|
|a 19920728d u fre 0103
|
| 200 |
1 |
|
|a Characterization of semiconductor materials
|e Principles and methods
|
| 210 |
|
|
|a Park Ridge, N.J.
|c Noyes Publications
|d 1989
|
| 215 |
|
|
|a XII-330 p.
|d 25 cm
|
| 300 |
|
|
|a Volume 1
|
| 606 |
|
|
|a Semiconducteurs
|x Matériaux
|
| 700 |
|
1 |
|a MacGuire
|b Gary
|
| 801 |
|
|
|a FR
|b DYNIX_BUNAN
|c 19920728
|g AFNOR
|
| 979 |
|
|
|a SCI
|
| 993 |
|
|
|a 1160367400
|b SCI
|c 620.179 MAC
|d EM
|e PHYAP12
|f I
|g 28-07-1992
|h 02-02-2000
|i 08-07-2003
|o 05-03-2002
|p 9
|s C 7451
|t EM
|u SCING12
|v i
|
| 998 |
|
|
|a 318966
|
Nantilus
