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Applied scanning probe methods : III Characterization
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope,...
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| Auteurs principaux : | , |
|---|---|
| Format : | Livre |
| Langue : | anglais |
| Titre complet : | Applied scanning probe methods. III, Characterization / edited by Bharat Bhushan, Harald Fuchs |
| Édition : | 1st ed. 2006. |
| Publié : |
Berlin, Heidelberg :
Springer Berlin Heidelberg
, [20..] Cham : Springer Nature |
| Collection : | Nanoscience and technology (Internet) |
| Accès en ligne : |
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| Contenu : | Atomic Force Microscopy in Nanomedicine. Scanning Probe Microscopy: From Living Cells to the Subatomic Range. Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces. Probing Macromolecular Dynamics and the Influence of Finite Size Effects. Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum. One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures. Scanning Probe Microscopy Applied to Ferroelectric Materials. Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy. AFM Applications for Contact and Wear Simulation. AFM Applications for Analysis of Fullerene-Like Nanoparticles. Scanning Probe Methods in the Magnetic Tape Industry |
| Sujets : | |
| Documents associés : | Autre format:
Applied scanning probe methods III Autre format: Applied Scanning Probe Methods III Autre format: Applied Scanning Probe Methods III |
| LEADER | 05528clm a2200745 4500 | ||
|---|---|---|---|
| 001 | PPN123125596 | ||
| 003 | http://www.sudoc.fr/123125596 | ||
| 005 | 20241002160100.0 | ||
| 010 | |a 978-3-540-26910-6 | ||
| 017 | 7 | 0 | |a 10.1007/b138285 |2 DOI |
| 035 | |a (OCoLC)690281820 | ||
| 035 | |a Springer978-3-540-26910-6 | ||
| 035 | |a SPRINGER_EBOOKS_LN_PLURI_10.1007/b138285 | ||
| 035 | |a Springer-11644-978-3-540-26910-6 | ||
| 100 | |a 20080410f20 u y0frey0103 ba | ||
| 101 | 0 | |a eng |2 639-2 | |
| 102 | |a DE | ||
| 135 | |a dr||||||||||| | ||
| 181 | |6 z01 |c txt |2 rdacontent | ||
| 181 | 1 | |6 z01 |a i# |b xxxe## | |
| 182 | |6 z01 |c c |2 rdamedia | ||
| 182 | 1 | |6 z01 |a b | |
| 183 | |6 z01 |a ceb |2 RDAfrCarrier | ||
| 200 | 1 | |a Applied scanning probe methods |h III |i Characterization |f edited by Bharat Bhushan, Harald Fuchs | |
| 205 | |a 1st ed. 2006. | ||
| 214 | 0 | |a Berlin, Heidelberg |c Springer Berlin Heidelberg | |
| 214 | 2 | |a Cham |c Springer Nature |d [20..] | |
| 225 | 0 | |a NanoScience and Technology |x 2197-7127 | |
| 327 | 1 | |a Atomic Force Microscopy in Nanomedicine |a Scanning Probe Microscopy: From Living Cells to the Subatomic Range |a Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces |a Probing Macromolecular Dynamics and the Influence of Finite Size Effects |a Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum |a One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures |a Scanning Probe Microscopy Applied to Ferroelectric Materials |a Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy |a AFM Applications for Contact and Wear Simulation |a AFM Applications for Analysis of Fullerene-Like Nanoparticles |a Scanning Probe Methods in the Magnetic Tape Industry | |
| 330 | |a The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes | ||
| 371 | 0 | |a Accès en ligne pour les établissements français bénéficiaires des licences nationales | |
| 371 | 0 | |a Accès soumis à abonnement pour tout autre établissement | |
| 371 | 1 | |a Conditions particulières de réutilisation pour les bénéficiaires des licences nationales |c https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 | |
| 410 | | | |0 17428859X |t Nanoscience and technology (Internet) |x 2197-7127 | |
| 452 | | | |0 107983281 |t Applied scanning probe methods III |o characterization |f edited by Bharat Bhushan, Harald Fuchs |c Berlin |n Springer |d 2006 |p 1 vol. (XLIII-378 p.) |s Nanoscience and technology |y 3-540-26909-6 | |
| 452 | | | |t Applied Scanning Probe Methods III |b Texte imprimé |y 9783642065965 | |
| 452 | | | |t Applied Scanning Probe Methods III |b Texte imprimé |y 9783540812654 | |
| 610 | 1 | |a Chemistry | |
| 610 | 2 | |a Physical Chemistry | |
| 610 | 2 | |a Solid State Physics and Spectroscopy | |
| 610 | 2 | |a Analytical Chemistry | |
| 610 | 2 | |a Nanotechnology | |
| 610 | 2 | |a Surfaces and Interfaces, Thin Films | |
| 610 | 2 | |a Polymer Sciences | |
| 610 | 1 | |a Nanotechnology and Microengineering | |
| 610 | 2 | |a Spectroscopy and Microscopy | |
| 610 | 2 | |a Surface and Interface Science, Thin Films | |
| 615 | |a @Chemistry and Materials Science |n 11644; ZDB-2-CMS |2 Springer | ||
| 615 | |a @Chemistry and Materials Science |n 11644 |2 Springer | ||
| 615 | |a Chemistry and Materials Science |n 11644 |2 Springer | ||
| 676 | |a 620.5 |v 23 | ||
| 680 | |a T174.7 | ||
| 700 | 1 | |a Bhushan |b Bharat |4 651 | |
| 701 | 1 | |a Fuchs |b Harald |4 651 | |
| 801 | 3 | |a FR |b Abes |c 20240911 |g AFNOR | |
| 801 | 1 | |a DE |b Springer |c 20220104 |g AACR2 | |
| 856 | 4 | |q PDF |u https://doi.org/10.1007/b138285 |z Accès sur la plateforme de l'éditeur | |
| 856 | 4 | |u https://revue-sommaire.istex.fr/ark:/67375/8Q1-J2S140CG-3 |z Accès sur la plateforme Istex | |
| 856 | 4 | |5 441099901:830928790 |u https://budistant.univ-nantes.fr/login?url=https://doi.org/10.1007/b138285 | |
| 915 | |5 441099901:830928790 |b SPRING4-00234 | ||
| 930 | |5 441099901:830928790 |b 441099901 |j g | ||
| 979 | |a NUM | ||
| 991 | |5 441099901:830928790 |a Exemplaire créé en masse par ITEM le 01-10-2024 15:46 | ||
| 997 | |a NUM |b SPRING4-00234 |d NUMpivo |e EM |s d | ||
| 998 | |a 980227 | ||