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Scanning probe microscopy : atomic scale engineering by forces and currents
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives...
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| Auteurs principaux : | , |
|---|---|
| Format : | Livre |
| Langue : | anglais |
| Titre complet : | Scanning probe microscopy : atomic scale engineering by forces and currents / by Adam Foster, Werner Hofer. |
| Édition : | 1st ed. 2006. |
| Publié : |
New York, NY :
Springer New York
, [20..] Cham : Springer Nature |
| Collection : | Nanoscience and technology (Internet) |
| Accès en ligne : |
Accès Nantes Université
Accès direct soit depuis les campus via le réseau ou le wifi eduroam soit à distance avec un compte @etu.univ-nantes.fr ou @univ-nantes.fr |
| Note sur l'URL : | Accès sur la plateforme de l'éditeur Accès sur la plateforme Istex |
| Condition d'utilisation et de reproduction : | Conditions particulières de réutilisation pour les bénéficiaires des licences nationales : https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017 |
| Contenu : | The Physics of Scanning Probe Microscopes. SPM: The Instrument. Theory of Forces. Electron Transport Theory. Transport in the Low Conductance Regime. Bringing Theory to Experiment in SFM. Topographic images. Single-Molecule Chemistry. Current and Force Spectroscopy. Outlook |
| Sujets : | |
| Documents associés : | Autre format:
Scanning probe microscopy |
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| 330 | |a Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data | ||
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