Scanning probe microscopy : atomic scale engineering by forces and currents

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives...

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Détails bibliographiques
Auteurs principaux : Foster Adam Stuart (Auteur), Hofer Werner A. (Auteur)
Format : Livre
Langue : anglais
Titre complet : Scanning probe microscopy : atomic scale engineering by forces and currents / by Adam Foster, Werner Hofer.
Édition : 1st ed. 2006.
Publié : New York, NY : Springer New York , [20..]
Cham : Springer Nature
Collection : Nanoscience and technology (Internet)
Accès en ligne : Accès Nantes Université
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Condition d'utilisation et de reproduction : Conditions particulières de réutilisation pour les bénéficiaires des licences nationales : https://www.licencesnationales.fr/springer-nature-ebooks-contrat-licence-ln-2017
Contenu : The Physics of Scanning Probe Microscopes. SPM: The Instrument. Theory of Forces. Electron Transport Theory. Transport in the Low Conductance Regime. Bringing Theory to Experiment in SFM. Topographic images. Single-Molecule Chemistry. Current and Force Spectroscopy. Outlook
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Documents associés : Autre format: Scanning probe microscopy
Description
Résumé : Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data
ISBN : 978-0-387-37231-0
DOI : 10.1007/0-387-37231-8