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Electron microscopy and analysis
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| Main Author : | |
|---|---|
| Format : | Book |
| Language : | anglais |
| Title statement : | Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland |
| Edition : | 3rd ed. |
| Published : |
London, New York :
Taylor & Francis
, 2000 |
| Physical Description : | x-251 p. |
| Subjects : |
BU Sciences
| Location | Call Number | Loan type | Status |
|---|---|---|---|
| Magasin n.3 | 537.5 GOO/15778 | Empruntable | Available |