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| LEADER |
00825nam a22002411 4500 |
| 001 |
PPN022166475 |
| 005 |
20171205015800.0 |
| 009 |
DYNIX_BUNAN_144735 |
| 010 |
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1 |
|a 0-89006-465-2
|
| 100 |
0 |
0 |
|a 19940228d1991 u0frey0103 ba
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| 101 |
0 |
0 |
|a eng
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| 102 |
0 |
0 |
|a US
|
| 200 |
1 |
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|a Reliability and degradation of semiconductor lasers and LEDs
|
| 210 |
|
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|a London
|a Boston
|c Artech House
|d 1991
|
| 215 |
|
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|a X-343 p.
|c ill.
|d 24 cm
|
| 606 |
|
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|a Lasers à semiconducteurs
|x fiabilité
|
| 606 |
|
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|a Diodes électroluminescentes
|x fiabilité
|
| 606 |
|
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|a Diodes électroluminescentes
|
| 700 |
|
1 |
|a Fukuda
|b Mitsuo
|
| 801 |
|
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|a FR
|b DYNIX_BUNAN
|c 19940228
|g AFNOR
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| 979 |
|
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|a SCI
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| 993 |
|
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|a 1160504027
|b SCI
|c 621.375.8 FUK
|d EM
|e PHYAP12
|f I
|g 13-10-1993
|h 02-02-2000
|i 08-07-2003
|k 105.19
|o 13-12-2000
|p 10
|s 050402
|t EM
|u SCING12
|v i
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| 998 |
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|a 256199
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